I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Design and Defect Analysis of C17 Benchmark Circuit using Q..:
, In:
2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)
,
Chakrabarty, Ratna
- p. 1-7 , 2023
Link:
https://doi.org/10.1109/IEMENTech60402.2023.10423547
RT T1 <cTitle>2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)</cTitle>: T1 <Title>Design and Defect Analysis of C17 Benchmark Circuit using QCA and HDL</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10423547&Exemplar=1&LAN=DE A1 Chakrabarty, Ratna YR 2023 SN 2767-9934 K1 VHDL K1 Benchmark testing K1 Very large scale integration K1 CMOS technology K1 Software K1 Circuit faults K1 Integrated circuit modeling K1 Benchmark Circuit K1 Cellular Automata K1 QCA Designer K1 Quantum Dot K1 Stuck at fault SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IEMENTech60402.2023.10423547 DO https://doi.org/10.1109/IEMENTech60402.2023.10423547 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
