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1 Ergebnisse
1
Design and Defect Analysis of C17 Benchmark Circuit using Q..:
, In:
2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)
,
Chakrabarty, Ratna
- p. 1-7 , 2023
Link:
https://doi.org/10.1109/IEMENTech60402.2023.10423547
RT T1
2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)
: T1
Design and Defect Analysis of C17 Benchmark Circuit using QCA and HDL
UL https://suche.suub.uni-bremen.de/peid=ieee-10423547&Exemplar=1&LAN=DE A1 Chakrabarty, Ratna YR 2023 SN 2767-9934 K1 VHDL K1 Benchmark testing K1 Very large scale integration K1 CMOS technology K1 Software K1 Circuit faults K1 Integrated circuit modeling K1 Benchmark Circuit K1 Cellular Automata K1 QCA Designer K1 Quantum Dot K1 Stuck at fault SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IEMENTech60402.2023.10423547 DO https://doi.org/10.1109/IEMENTech60402.2023.10423547 SF ELIB - SuUB Bremen
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