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1 Ergebnisse
1
A SAR-Based Fast Automatic Digital Calibration Circuit of O..:
, In:
2023 IEEE 17th International Conference on Anti-counterfeiting, Security, and Identification (ASID)
,
Lin, Xiaotian
;
Shen, Chongfei
;
Qiu, Sihai
... - p. 152-156 , 2023
Link:
https://doi.org/10.1109/ASID60355.2023.10426380
RT T1
2023 IEEE 17th International Conference on Anti-counterfeiting, Security, and Identification (ASID)
: T1
A SAR-Based Fast Automatic Digital Calibration Circuit of On-Chip Clock
UL https://suche.suub.uni-bremen.de/peid=ieee-10426380&Exemplar=1&LAN=DE A1 Lin, Xiaotian A1 Shen, Chongfei A1 Qiu, Sihai A1 Liu, Xu A1 Li, Bingjie A1 Wan, Peiyuan YR 2023 SN 2163-5056 K1 Temperature distribution K1 Reliability engineering K1 Calibration K1 System-on-chip K1 Security K1 Oscillators K1 Clocks K1 digital automatic calibration K1 high speed K1 SAR logic K1 shake hand SP 152 OP 156 LK http://dx.doi.org/https://doi.org/10.1109/ASID60355.2023.10426380 DO https://doi.org/10.1109/ASID60355.2023.10426380 SF ELIB - SuUB Bremen
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