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1 Ergebnisse
1
Research on countermeasures against FPGA memory bit upset i..:
, In:
2023 10th International Forum on Electrical Engineering and Automation (IFEEA)
,
Chen, Zhaohui
;
Zhang, Chi
;
Ding, Xiaobing
... - p. 354-359 , 2023
Link:
https://doi.org/10.1109/IFEEA60725.2023.10429644
RT T1
2023 10th International Forum on Electrical Engineering and Automation (IFEEA)
: T1
Research on countermeasures against FPGA memory bit upset in the merging unit device
UL https://suche.suub.uni-bremen.de/peid=ieee-10429644&Exemplar=1&LAN=DE A1 Chen, Zhaohui A1 Zhang, Chi A1 Ding, Xiaobing A1 Liu, Wei A1 Huang, Jiajun A1 Zhou, Zhaoqing YR 2023 K1 Radiation effects K1 Semiconductor device measurement K1 Merging K1 Redundancy K1 Life estimation K1 Neutrons K1 Field programmable gate arrays K1 FPGA memory K1 bit upset K1 redundancy check K1 fault injection K1 neutron irradiation test SP 354 OP 359 LK http://dx.doi.org/https://doi.org/10.1109/IFEEA60725.2023.10429644 DO https://doi.org/10.1109/IFEEA60725.2023.10429644 SF ELIB - SuUB Bremen
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