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Metamorphic Testing for the Deepfake Detection Model:

, In: 2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security Companion (QRS-C),
Pang, ChenXin ; Pan, Ya ; Bai, Hanli - p. 1-8 , 2023
Link: https://doi.org/10.1109/QRS-C60940.2023.00012