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1 Ergebnisse
1
Improved Flying Probe-Inspired In-Circuit Tester for Practi..:
, In:
2023 IEEE 29th International Symposium for Design and Technology in Electronic Packaging (SIITME)
,
Rotar, Raul
;
Jurj, Sorin Liviu
;
Rohatinovici, Noemi-Clara
... - p. 34-40 , 2023
Link:
https://doi.org/10.1109/SIITME59799.2023.10430652
RT T1 <cTitle>2023 IEEE 29th International Symposium for Design and Technology in Electronic Packaging (SIITME)</cTitle>: T1 <Title>Improved Flying Probe-Inspired In-Circuit Tester for Practical Laboratory Activities</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10430652&Exemplar=1&LAN=DE A1 Rotar, Raul A1 Jurj, Sorin Liviu A1 Rohatinovici, Noemi-Clara A1 Brincovan, Raul A1 Opritoiu, Flavius A1 Vladutiu, Mircea YR 2023 SN 2642-7036 K1 Power demand K1 Voltage measurement K1 Prototypes K1 Robot sensing systems K1 Time measurement K1 Probes K1 Testing K1 Flying Probe K1 In-Circuit Testing K1 Printed Circuit Board K1 Fault Detection K1 Education SP 34 OP 40 LK http://dx.doi.org/https://doi.org/10.1109/SIITME59799.2023.10430652 DO https://doi.org/10.1109/SIITME59799.2023.10430652 SF ELIB - SuUB Bremen
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