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1 Ergebnisse
1
A novel unsupervised deep transfer learning method based on..:
, In:
2023 IEEE 2nd Industrial Electronics Society Annual On-Line Conference (ONCON)
,
Cao, Jungang
;
Yang, Zhe
;
Huang, Yunwei
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ONCON60463.2023.10431100
RT T1 <cTitle>2023 IEEE 2nd Industrial Electronics Society Annual On-Line Conference (ONCON)</cTitle>: T1 <Title>A novel unsupervised deep transfer learning method based on contrast pre-training for fault diagnosis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10431100&Exemplar=1&LAN=DE A1 Cao, Jungang A1 Yang, Zhe A1 Huang, Yunwei A1 Guo, Jianwen A1 Li, Chuan A1 Jiang, Lingli A1 Long, Jianyu YR 2023 K1 Fault diagnosis K1 Transfer learning K1 Feature extraction K1 Data models K1 Encoding K1 Adversarial machine learning K1 Machinery K1 contrast coding K1 unsupervised transfer learning SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ONCON60463.2023.10431100 DO https://doi.org/10.1109/ONCON60463.2023.10431100 SF ELIB - SuUB Bremen
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