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1 Ergebnisse
1
Software Susceptibility Detection Using Deep Learning Techn..:
, In:
2023 10th IEEE Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON)
,
Kumar, K. Sudheer
;
Sahu, Dillip Narayan
;
Takore, Tamirat Tagesse
... - p. 681-685 , 2023
Link:
https://doi.org/10.1109/UPCON59197.2023.10434605
RT T1
2023 10th IEEE Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON)
: T1
Software Susceptibility Detection Using Deep Learning Techniques
UL https://suche.suub.uni-bremen.de/peid=ieee-10434605&Exemplar=1&LAN=DE A1 Kumar, K. Sudheer A1 Sahu, Dillip Narayan A1 Takore, Tamirat Tagesse A1 Singh, Navdeep A1 Durga, CSL Vijaya A1 Kapila, Dhiraj YR 2023 SN 2687-7767 K1 Measurement K1 Deep learning K1 Codes K1 Source coding K1 Artificial neural networks K1 Feature extraction K1 Software K1 Susceptibilities K1 machine learning methods K1 deep learning K1 AVP SP 681 OP 685 LK http://dx.doi.org/https://doi.org/10.1109/UPCON59197.2023.10434605 DO https://doi.org/10.1109/UPCON59197.2023.10434605 SF ELIB - SuUB Bremen
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