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1 Ergebnisse
1
Artificial Intelligence Based Examination of the Field of O..:
, In:
2023 10th IEEE Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON)
,
Bhargavi, V.Sesha
;
Selvaraj, Krishnamoorthy
;
Koti, Valli Madhavi
... - p. 1617-1623 , 2023
Link:
https://doi.org/10.1109/UPCON59197.2023.10434747
RT T1 <cTitle>2023 10th IEEE Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON)</cTitle>: T1 <Title>Artificial Intelligence Based Examination of the Field of Ophthalmology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10434747&Exemplar=1&LAN=DE A1 Bhargavi, V.Sesha A1 Selvaraj, Krishnamoorthy A1 Koti, Valli Madhavi A1 Maheshwari, Rajeev Kumar A1 RadhaMahendran, S. A1 Chandra, Sukumar YR 2023 SN 2687-7767 K1 Glaucoma K1 Support vector machines K1 Visualization K1 Ophthalmology K1 Classification algorithms K1 Convolutional neural networks K1 Reliability K1 Artificial Intelligence K1 SVM (Support Vector Machines) K1 CNN (Convolutional Neural Networks) K1 etc SP 1617 OP 1623 LK http://dx.doi.org/https://doi.org/10.1109/UPCON59197.2023.10434747 DO https://doi.org/10.1109/UPCON59197.2023.10434747 SF ELIB - SuUB Bremen
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