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1 Ergebnisse
1
fT extraction of HEMT transistors at mm-waves through EM-si..:
, In:
2024 IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
,
Medbouhi, Mohammed
;
Lugo-Alvarez, Jose
;
Ferrari, Philippe
. - p. 52-55 , 2024
Link:
https://doi.org/10.1109/SiRF59913.2024.10438528
RT T1 <cTitle>2024 IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)</cTitle>: T1 <Title>fT extraction of HEMT transistors at mm-waves through EM-simulated de-embedding devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10438528&Exemplar=1&LAN=DE A1 Medbouhi, Mohammed A1 Lugo-Alvarez, Jose A1 Ferrari, Philippe A1 Morvan, Erwan YR 2024 SN 2474-9761 K1 Millimeter wave measurements K1 Transmission line measurements K1 Size measurement K1 Time measurement K1 Silicon K1 Frequency measurement K1 Standards K1 millimeter-waves K1 CMOS K1 cut-off frequency (fT) K1 de-embedding K1 EM simulations SP 52 OP 55 LK http://dx.doi.org/https://doi.org/10.1109/SiRF59913.2024.10438528 DO https://doi.org/10.1109/SiRF59913.2024.10438528 SF ELIB - SuUB Bremen
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