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1 Ergebnisse
1
A Highly Reliable Cryogenic Microelectromechanical Switch W..:
, In:
2024 IEEE 37th International Conference on Micro Electro Mechanical Systems (MEMS)
,
Lee, So-Young
;
Lee, Yong-Bok
;
Kim, Tae-Soo
... - p. 569-572 , 2024
Link:
https://doi.org/10.1109/MEMS58180.2024.10439335
RT T1 <cTitle>2024 IEEE 37th International Conference on Micro Electro Mechanical Systems (MEMS)</cTitle>: T1 <Title>A Highly Reliable Cryogenic Microelectromechanical Switch With Slot-Spring Structure For Quantum Computing Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10439335&Exemplar=1&LAN=DE A1 Lee, So-Young A1 Lee, Yong-Bok A1 Kim, Tae-Soo A1 Lee, Seung-Jun A1 Kim, Sung-Ho A1 Lee, Jisung A1 Park, Seung-Young A1 Yoon, Jun-Bo YR 2024 SN 2160-1968 K1 Temperature K1 Quantum computing K1 Microswitches K1 Cryogenics K1 Voltage K1 Stress K1 Thermal stresses K1 Microelectromechanical (MEM) switch K1 Slot-spring K1 Cryogenic temperature K1 Quantum computing application SP 569 OP 572 LK http://dx.doi.org/https://doi.org/10.1109/MEMS58180.2024.10439335 DO https://doi.org/10.1109/MEMS58180.2024.10439335 SF ELIB - SuUB Bremen
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