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1 Ergebnisse
1
DC Hot Switching Lifetime Study for Contact MEMS Switch by ..:
, In:
2024 IEEE 37th International Conference on Micro Electro Mechanical Systems (MEMS)
,
Zhang, Yulong
;
Sun, Jianwen
;
Liu, Huiliang
.. - p. 610-613 , 2024
Link:
https://doi.org/10.1109/MEMS58180.2024.10439563
RT T1 <cTitle>2024 IEEE 37th International Conference on Micro Electro Mechanical Systems (MEMS)</cTitle>: T1 <Title>DC Hot Switching Lifetime Study for Contact MEMS Switch by Weibull Distribution Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10439563&Exemplar=1&LAN=DE A1 Zhang, Yulong A1 Sun, Jianwen A1 Liu, Huiliang A1 Wei, Jiangtao A1 Liu, Zewen YR 2024 SN 2160-1968 K1 Contacts K1 Microswitches K1 Sociology K1 Voltage K1 Mathematical models K1 Weibull distribution K1 Statistics K1 Contact K1 MEMS switch K1 Hot switching K1 Lifetime SP 610 OP 613 LK http://dx.doi.org/https://doi.org/10.1109/MEMS58180.2024.10439563 DO https://doi.org/10.1109/MEMS58180.2024.10439563 SF ELIB - SuUB Bremen
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