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1 Ergebnisse
1
Domain Generalization for Face Forgery Detection by Style T..:
, In:
2024 IEEE International Conference on Consumer Electronics (ICCE)
,
Kim, Taehoon
;
Choi, Jongwook
;
Cho, Hyunjin
.. - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ICCE59016.2024.10444215
RT T1 <cTitle>2024 IEEE International Conference on Consumer Electronics (ICCE)</cTitle>: T1 <Title>Domain Generalization for Face Forgery Detection by Style Transfer</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10444215&Exemplar=1&LAN=DE A1 Kim, Taehoon A1 Choi, Jongwook A1 Cho, Hyunjin A1 Lim, HyoungJun A1 Choi, Jongwon YR 2024 SN 2158-4001 K1 Training K1 Degradation K1 Deepfakes K1 Detectors K1 Forgery K1 Faces K1 Consumer electronics K1 Deepfake detection K1 forgery detection K1 data augmentation K1 style transfer SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICCE59016.2024.10444215 DO https://doi.org/10.1109/ICCE59016.2024.10444215 SF ELIB - SuUB Bremen
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