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(Un)fair Exposure in Deep Face Rankings at a Distance:

, In: 2023 IEEE International Joint Conference on Biometrics (IJCB),
Atzori, Andrea ; Fenu, Gianni ; Marras, Mirko - p. 1-9 , 2023
Link: https://doi.org/10.1109/IJCB57857.2023.10449007