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1 Ergebnisse
1
Convolutional Neural Network Based On-Line Defect Recogniti..:
, In:
2023 4th International Conference on Computation, Automation and Knowledge Management (ICCAKM)
,
Varade, Harshal P.
;
Bhangale, Sonal C.
;
Patare, P. M.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ICCAKM58659.2023.10449655
RT T1 <cTitle>2023 4th International Conference on Computation, Automation and Knowledge Management (ICCAKM)</cTitle>: T1 <Title>Convolutional Neural Network Based On-Line Defect Recognition in Additive Manufacturing Using Image Processing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10449655&Exemplar=1&LAN=DE A1 Varade, Harshal P. A1 Bhangale, Sonal C. A1 Patare, P. M. A1 Ghanghav, Vaibhav A1 Sharma, Santosh Kumar A1 William, P. YR 2023 K1 Training K1 Quality assurance K1 Manufacturing processes K1 Image recognition K1 Three-dimensional printing K1 Convolutional neural networks K1 Testing K1 Machine learning K1 Additive Manufacturing K1 Fault recognition K1 Image Processing K1 convolutional neural networks (CNN) K1 Selective Laser Melting (SLM) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICCAKM58659.2023.10449655 DO https://doi.org/10.1109/ICCAKM58659.2023.10449655 SF ELIB - SuUB Bremen
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