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Embedded Vision Solution for Defect Detection and Counting ..:

, In: 2023 IEEE 11th International Conference on Systems and Control (ICSC),
Zaway, Lassaad ; Ktari, Jalel ; Amor, Nader Ben.. - p. 444-448 , 2023
Link: https://doi.org/10.1109/ICSC58660.2023.10449780