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1 Ergebnisse
1
Embedded Vision Solution for Defect Detection and Counting ..:
, In:
2023 IEEE 11th International Conference on Systems and Control (ICSC)
,
Zaway, Lassaad
;
Ktari, Jalel
;
Amor, Nader Ben
.. - p. 444-448 , 2023
Link:
https://doi.org/10.1109/ICSC58660.2023.10449780
RT T1
2023 IEEE 11th International Conference on Systems and Control (ICSC)
: T1
Embedded Vision Solution for Defect Detection and Counting in Industry 4.0
UL https://suche.suub.uni-bremen.de/peid=ieee-10449780&Exemplar=1&LAN=DE A1 Zaway, Lassaad A1 Ktari, Jalel A1 Amor, Nader Ben A1 Jallouli, Mohamed A1 Talmoudi, Maher YR 2023 SN 2379-0067 K1 Training K1 Standards organizations K1 Transforms K1 Streaming media K1 Fourth Industrial Revolution K1 Streams K1 Defect detection K1 Manufacturing defect detection K1 Haar classifier Raspberry K1 OpenCV K1 Paradox SP 444 OP 448 LK http://dx.doi.org/https://doi.org/10.1109/ICSC58660.2023.10449780 DO https://doi.org/10.1109/ICSC58660.2023.10449780 SF ELIB - SuUB Bremen
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