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1 Ergebnisse
1
Characterizing CNTFET Logic Gate and Adder Performance Trad..:
, In:
2023 IEEE 9th International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE)
,
Fuad, Mahamudul Hassan
;
Noor, Sheikh Shahrier
;
Hassan, K.M. Mehedi
... - p. 206-211 , 2023
Link:
https://doi.org/10.1109/WIECON-ECE60392.2023.10456438
RT T1 <cTitle>2023 IEEE 9th International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE)</cTitle>: T1 <Title>Characterizing CNTFET Logic Gate and Adder Performance Trade-offs by considering CNT Tube Diameter and Dielectric Constant</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10456438&Exemplar=1&LAN=DE A1 Fuad, Mahamudul Hassan A1 Noor, Sheikh Shahrier A1 Hassan, K.M. Mehedi A1 Rahman, Mostafuzar A1 Labony, Hosne Ara Khatun A1 Nayan, Faysal YR 2023 SN 2837-8245 K1 Dielectric constant K1 Power demand K1 Photonic band gap K1 Logic gates K1 Electron tubes K1 CNTFETs K1 Delays K1 Tube diameter K1 CNTFET K1 PDP K1 Power Consumption SP 206 OP 211 LK http://dx.doi.org/https://doi.org/10.1109/WIECON-ECE60392.2023.10456438 DO https://doi.org/10.1109/WIECON-ECE60392.2023.10456438 SF ELIB - SuUB Bremen
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