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1 Ergebnisse
1
On Fault-Tolerant Microarchitectural Techniques for Voltage..:
, In:
2023 26th Euromicro Conference on Digital System Design (DSD)
,
Toca-Diaz, Yamilka
;
Munoz, Nicolas Landeros
;
Tejero, Ruben Gran
. - p. 138-145 , 2023
Link:
https://doi.org/10.1109/DSD60849.2023.00029
RT T1
2023 26th Euromicro Conference on Digital System Design (DSD)
: T1
On Fault-Tolerant Microarchitectural Techniques for Voltage Underscaling in On-Chip Memories of CNN Accelerators
UL https://suche.suub.uni-bremen.de/peid=ieee-10456839&Exemplar=1&LAN=DE A1 Toca-Diaz, Yamilka A1 Munoz, Nicolas Landeros A1 Tejero, Ruben Gran A1 Valero, Alejandro YR 2023 SN 2771-2508 K1 Energy consumption K1 Low voltage K1 Microarchitecture K1 Manufacturing processes K1 System performance K1 Memory management K1 Voltage K1 Deep learning K1 energy efficiency K1 network accuracy K1 permanent faults SP 138 OP 145 LK http://dx.doi.org/https://doi.org/10.1109/DSD60849.2023.00029 DO https://doi.org/10.1109/DSD60849.2023.00029 SF ELIB - SuUB Bremen
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