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1 Ergebnisse
1
Targeting different defect-oriented fault models in IC test..:
, In:
2023 26th Euromicro Conference on Digital System Design (DSD)
,
Mirabella, N.
;
Floridia, A.
;
Cantoro, R.
.. - p. 214-219 , 2023
Link:
https://doi.org/10.1109/DSD60849.2023.00039
RT T1
2023 26th Euromicro Conference on Digital System Design (DSD)
: T1
Targeting different defect-oriented fault models in IC testing: an experimental approach
UL https://suche.suub.uni-bremen.de/peid=ieee-10456873&Exemplar=1&LAN=DE A1 Mirabella, N. A1 Floridia, A. A1 Cantoro, R. A1 Grosso, M. A1 Reorda, M. Sonza YR 2023 SN 2771-2508 K1 Digital systems K1 Benchmark testing K1 Libraries K1 Delays K1 Manufacturing K1 Circuit faults K1 Test pattern generators K1 ATPG K1 cell-aware K1 path delay K1 testing K1 design for testability K1 defect testing SP 214 OP 219 LK http://dx.doi.org/https://doi.org/10.1109/DSD60849.2023.00039 DO https://doi.org/10.1109/DSD60849.2023.00039 SF ELIB - SuUB Bremen
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