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1 Ergebnisse
1
Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-cha..:
, In:
2024 International Conference on Electronics, Information, and Communication (ICEIC)
,
Suh, Sungho
;
Lee, Haebom
;
Kang, Tae Yeob
- p. 1-4 , 2024
Link:
https://doi.org/10.1109/ICEIC61013.2024.10457097
RT T1 <cTitle>2024 International Conference on Electronics, Information, and Communication (ICEIC)</cTitle>: T1 <Title>Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-channel S-parameter Patterns</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10457097&Exemplar=1&LAN=DE A1 Suh, Sungho A1 Lee, Haebom A1 Kang, Tae Yeob YR 2024 SN 2767-7699 K1 Fault diagnosis K1 Electrodes K1 Visualization K1 Indium tin oxide K1 Sensor phenomena and characterization K1 Robustness K1 Real-time systems K1 ITO transparent electrodes K1 S-parameter K1 Convolutional Neural Networks SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEIC61013.2024.10457097 DO https://doi.org/10.1109/ICEIC61013.2024.10457097 SF ELIB - SuUB Bremen
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