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1 Ergebnisse
1
Methodology for Lithography Hotspot Detection using ResNet5..:
, In:
2024 International Conference on Electronics, Information, and Communication (ICEIC)
,
Kim, Su-min
;
Jeon, Jae-wook
- p. 1-4 , 2024
Link:
https://doi.org/10.1109/ICEIC61013.2024.10457195
RT T1 <cTitle>2024 International Conference on Electronics, Information, and Communication (ICEIC)</cTitle>: T1 <Title>Methodology for Lithography Hotspot Detection using ResNet50V2 and Model soups</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10457195&Exemplar=1&LAN=DE A1 Kim, Su-min A1 Jeon, Jae-wook YR 2024 SN 2767-7699 K1 Semiconductor device modeling K1 Training K1 Industries K1 Lithography K1 Electronics industry K1 Transfer learning K1 Focusing K1 Lithography Hotspot K1 Transfer Learning K1 ResNet50V2 K1 Model soups SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEIC61013.2024.10457195 DO https://doi.org/10.1109/ICEIC61013.2024.10457195 SF ELIB - SuUB Bremen
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