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1 Ergebnisse
1
Optimizing Gate Insulator Conditions via Interfacial Oxidat..:
, In:
2024 International Conference on Electronics, Information, and Communication (ICEIC)
,
Hwang, Sang Hun
;
Hwang, Byung Seol
;
Hwang, Sang Ho
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/ICEIC61013.2024.10457204
RT T1
2024 International Conference on Electronics, Information, and Communication (ICEIC)
: T1
Optimizing Gate Insulator Conditions via Interfacial Oxidation in Vertical Structure TFTs
UL https://suche.suub.uni-bremen.de/peid=ieee-10457204&Exemplar=1&LAN=DE A1 Hwang, Sang Hun A1 Hwang, Byung Seol A1 Hwang, Sang Ho A1 Moon, Seung Jae A1 Lee, Jong Mo A1 Bae, Byung Seong YR 2024 SN 2767-7699 K1 Temperature dependence K1 Power demand K1 Three-dimensional displays K1 Production K1 Logic gates K1 Insulators K1 Oxidation K1 Vertical Structure TFTs K1 Interfacial oxidation K1 low power consumption SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEIC61013.2024.10457204 DO https://doi.org/10.1109/ICEIC61013.2024.10457204 SF ELIB - SuUB Bremen
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