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1 Ergebnisse
1
Defect Detection in the Manufacturing Domain Using Product ..:
, In:
2024 International Conference on Electronics, Information, and Communication (ICEIC)
,
Choi, Subin
;
Kim, Hyungmin
;
Cho, Hansang
- p. 1-4 , 2024
Link:
https://doi.org/10.1109/ICEIC61013.2024.10457208
RT T1 <cTitle>2024 International Conference on Electronics, Information, and Communication (ICEIC)</cTitle>: T1 <Title>Defect Detection in the Manufacturing Domain Using Product Design Data and Self-Knowledge Distillation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10457208&Exemplar=1&LAN=DE A1 Choi, Subin A1 Kim, Hyungmin A1 Cho, Hansang YR 2024 SN 2767-7699 K1 Deep learning K1 Solid modeling K1 Design automation K1 Feature extraction K1 Product design K1 Manufacturing K1 Quality assessment K1 Manufacturing industry K1 vision inspection system K1 defect detection K1 self-knowledge distillation SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEIC61013.2024.10457208 DO https://doi.org/10.1109/ICEIC61013.2024.10457208 SF ELIB - SuUB Bremen
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