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1 Ergebnisse
1
Comparison of Electrical Characteristics Between SiC and Si..:
, In:
2024 International Conference on Electronics, Information, and Communication (ICEIC)
,
Oh, Si Eun
;
Kim, Seo Yoon
;
Choi, Se Yong
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/ICEIC61013.2024.10457282
RT T1 <cTitle>2024 International Conference on Electronics, Information, and Communication (ICEIC)</cTitle>: T1 <Title>Comparison of Electrical Characteristics Between SiC and Si Substrate</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10457282&Exemplar=1&LAN=DE A1 Oh, Si Eun A1 Kim, Seo Yoon A1 Choi, Se Yong A1 Moon, Seung Jae A1 Lee, Jong Mo A1 Bae, Byung Seong YR 2024 SN 2767-7699 K1 Semiconductor device measurement K1 Schottky diodes K1 Silicon carbide K1 Capacitance-voltage characteristics K1 Metals K1 Optoelectronic devices K1 Silicon K1 Silicon Carbide (SiC) K1 Capacitance-Voltage (C-V) measurement K1 Schottky barrier diode SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEIC61013.2024.10457282 DO https://doi.org/10.1109/ICEIC61013.2024.10457282 SF ELIB - SuUB Bremen
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