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1 Ergebnisse
1
Identifying and Rectifying the Potential Faults in the Prob..:
, In:
2024 Annual Reliability and Maintainability Symposium (RAMS)
,
Sakurai, Atsushi
- p. 1-6 , 2024
Link:
https://doi.org/10.1109/RAMS51492.2024.10457608
RT T1 <cTitle>2024 Annual Reliability and Maintainability Symposium (RAMS)</cTitle>: T1 <Title>Identifying and Rectifying the Potential Faults in the Probabilistic Metric Formula in ISO 26262</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10457608&Exemplar=1&LAN=DE A1 Sakurai, Atsushi YR 2024 SN 2577-0993 K1 Measurement K1 Fault diagnosis K1 ISO Standards K1 Random access memory K1 Reliability engineering K1 Probabilistic logic K1 Hardware K1 Continuous-time Markov chain K1 Dual-point fault K1 Periodic inspections and repairs K1 Probabilistic metric for random hardware failures K1 Point unavailability density SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/RAMS51492.2024.10457608 DO https://doi.org/10.1109/RAMS51492.2024.10457608 SF ELIB - SuUB Bremen
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