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1 Ergebnisse
1
Numerical and Experimental Investigation of Package Warpage..:
, In:
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)
,
Zhang, Xiaowu
;
Lim, Sharon Pei Siang
;
Lau, Boon Long
... - p. 734-737 , 2023
Link:
https://doi.org/10.1109/EPTC59621.2023.10457614
RT T1
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)
: T1
Numerical and Experimental Investigation of Package Warpage of Large Mold-First FOWLP
UL https://suche.suub.uni-bremen.de/peid=ieee-10457614&Exemplar=1&LAN=DE A1 Zhang, Xiaowu A1 Lim, Sharon Pei Siang A1 Lau, Boon Long A1 Han, Yong A1 Jong, Ming Chinq A1 Wang, Xiaobai A1 Liu, Songlin YR 2023 K1 Integrated circuits K1 Industries K1 Temperature dependence K1 Temperature K1 Lead K1 Finite element analysis K1 Internet of Things SP 734 OP 737 LK http://dx.doi.org/https://doi.org/10.1109/EPTC59621.2023.10457614 DO https://doi.org/10.1109/EPTC59621.2023.10457614 SF ELIB - SuUB Bremen
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