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1 Ergebnisse
1
Mission Profile related Design for Reliability for Power El..:
, In:
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)
,
Albrecht, Jan
;
Horn, Tobias
;
Habenicht, Sonke
. - p. 722-726 , 2023
Link:
https://doi.org/10.1109/EPTC59621.2023.10457766
RT T1 <cTitle>2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)</cTitle>: T1 <Title>Mission Profile related Design for Reliability for Power Electronics based on Finite Element Simulation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10457766&Exemplar=1&LAN=DE A1 Albrecht, Jan A1 Horn, Tobias A1 Habenicht, Sonke A1 Rzepka, Sven YR 2023 K1 Thermomechanical processes K1 Switching loss K1 Electronic components K1 Thermal shock K1 Reliability engineering K1 Power electronics K1 Standards SP 722 OP 726 LK http://dx.doi.org/https://doi.org/10.1109/EPTC59621.2023.10457766 DO https://doi.org/10.1109/EPTC59621.2023.10457766 SF ELIB - SuUB Bremen
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