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1 Ergebnisse
1
Signal Energy based Probabilistic Inspection of Defect in C..:
, In:
2024 IEEE Applied Sensing Conference (APSCON)
,
Basu, Subhadeep
;
Gain, Supriya
;
Sinharay, Arijit
.. - p. 1-4 , 2024
Link:
https://doi.org/10.1109/APSCON60364.2024.10465905
RT T1
2024 IEEE Applied Sensing Conference (APSCON)
: T1
Signal Energy based Probabilistic Inspection of Defect in Composites
UL https://suche.suub.uni-bremen.de/peid=ieee-10465905&Exemplar=1&LAN=DE A1 Basu, Subhadeep A1 Gain, Supriya A1 Sinharay, Arijit A1 Chakravarty, Tapas A1 Pal, Arpan YR 2024 K1 Voltage measurement K1 Inspection K1 Probabilistic logic K1 Acoustics K1 Windows K1 Sensors K1 Standards K1 signal energy K1 structural health monitoring K1 composite K1 guided wave K1 RAPID SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/APSCON60364.2024.10465905 DO https://doi.org/10.1109/APSCON60364.2024.10465905 SF ELIB - SuUB Bremen
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