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1 Ergebnisse
1
Detection Of Image Forgery Using Error Level Analysis:
, In:
2024 International Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics (IITCEE)
,
Chandana, S
;
Nagarathna, C R
;
Amrutha, A
. - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IITCEE59897.2024.10467523
RT T1 <cTitle>2024 International Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics (IITCEE)</cTitle>: T1 <Title>Detection Of Image Forgery Using Error Level Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10467523&Exemplar=1&LAN=DE A1 Chandana, S A1 Nagarathna, C R A1 Amrutha, A A1 Jayasri, A YR 2024 K1 Training K1 Analytical models K1 Technological innovation K1 Digital images K1 Splicing K1 Computer architecture K1 Forgery K1 Error Level Analysis (ELA) K1 Convolutional Neural Networks (CNN) K1 Forgery Detection K1 Digital Image Processing K1 Machine Learning Algorithms SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IITCEE59897.2024.10467523 DO https://doi.org/10.1109/IITCEE59897.2024.10467523 SF ELIB - SuUB Bremen
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