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Using Neural Networks and Machine Learning Methods to Detec..:

, In: 2024 Conference of Young Researchers in Electrical and Electronic Engineering (ElCon),
Kanev, Anton I. ; Yurova, Evgenia O. ; Ponomareva, Marina O.. - p. 180-184 , 2024
Link: https://doi.org/10.1109/ElCon61730.2024.10468143