I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Space Mapped Neuromodeling for Fast & Accurate Signal Integ..:
, In:
2023 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)
,
Kushwaha, Suyash
;
Guglani, Surila
;
Soleimani, Nastaran
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDAPS58880.2023.10468464
RT T1 <cTitle>2023 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)</cTitle>: T1 <Title>Space Mapped Neuromodeling for Fast & Accurate Signal Integrity Analysis of Rough On-chip Copper Interconnects</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10468464&Exemplar=1&LAN=DE A1 Kushwaha, Suyash A1 Guglani, Surila A1 Soleimani, Nastaran A1 Pathania, Sunil A1 Kumar, Somesh A1 Trinchero, Riccardo A1 Roy, Sourajeet A1 Sharma, Rohit YR 2023 SN 2151-1233 K1 Training K1 Surface waves K1 Artificial neural networks K1 Packaging K1 Surface roughness K1 System-on-chip K1 Rough surfaces K1 Artificial neural network (ANN) K1 on-chip interconnects K1 surface roughness K1 signal integrity SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDAPS58880.2023.10468464 DO https://doi.org/10.1109/EDAPS58880.2023.10468464 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
