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1 Ergebnisse
1
Extraction of Drain Current Variability Components in Junct..:
, In:
2023 International Conference on Noise and Fluctuations (ICNF)
,
da Silva, Lucas Mota Barbosa
;
Pavanello, Marcelo Antonio
;
Casse, Mikael
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICNF57520.2023.10472773
RT T1
2023 International Conference on Noise and Fluctuations (ICNF)
: T1
Extraction of Drain Current Variability Components in Junctionless Nanowire Transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-10472773&Exemplar=1&LAN=DE A1 da Silva, Lucas Mota Barbosa A1 Pavanello, Marcelo Antonio A1 Casse, Mikael A1 Barraud, Sylvain A1 Vinet, Maud A1 Faynot, Olivier A1 de Souza, Michelly YR 2023 SN 2575-5595 K1 Resistance K1 Fluctuations K1 Silicon-on-insulator K1 Threshold voltage K1 Data models K1 Transistors K1 Junctionless nanowire transistors K1 Variability K1 FDSOI K1 Nanowire transistor K1 Junctionless SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICNF57520.2023.10472773 DO https://doi.org/10.1109/ICNF57520.2023.10472773 SF ELIB - SuUB Bremen
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