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Using Ensemble Inference to Improve Recall of Clone Detecti..:

, In: 2023 IEEE 17th International Workshop on Software Clones (IWSC),
Ahmed, Gul Aftab ; Patten, James Vincent ; Han, Yuanhua... - p. 15-21 , 2023
Link: https://doi.org/10.1109/IWSC60764.2023.00010