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1 Ergebnisse
1
Hard Error Correction in STT-MRAM:
, In:
2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC)
,
Hemaram, Surendra
;
Tahoori, Mehdi B
;
Catthoor, Francky
... - p. 752-757 , 2024
Link:
https://doi.org/10.1109/ASP-DAC58780.2024.10473796
RT T1 <cTitle>2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC)</cTitle>: T1 <Title>Hard Error Correction in STT-MRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10473796&Exemplar=1&LAN=DE A1 Hemaram, Surendra A1 Tahoori, Mehdi B A1 Catthoor, Francky A1 Rao, Siddharth A1 Couet, Sebastien A1 Kar, Gouri Sankar YR 2024 SN 2153-697X K1 Temperature sensors K1 Semiconductor device measurement K1 Torque K1 Measurement uncertainty K1 Encoding K1 Error correction K1 Manufacturing K1 STT-MRAM K1 Hard error K1 Block error correction pointer (BECP) K1 Error correction coding (ECC) SP 752 OP 757 LK http://dx.doi.org/https://doi.org/10.1109/ASP-DAC58780.2024.10473796 DO https://doi.org/10.1109/ASP-DAC58780.2024.10473796 SF ELIB - SuUB Bremen
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