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1 Ergebnisse
1
wearMeter: an Accurate Wear Metric for NAND Flash Memory:
, In:
2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC)
,
Ye, Min
;
Li, Qiao
;
Wen, Daniel
.. - p. 442-447 , 2024
Link:
https://doi.org/10.1109/ASP-DAC58780.2024.10473972
RT T1 <cTitle>2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC)</cTitle>: T1 <Title>wearMeter: an Accurate Wear Metric for NAND Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10473972&Exemplar=1&LAN=DE A1 Ye, Min A1 Li, Qiao A1 Wen, Daniel A1 Kuo, Tei-Wei A1 Xue, Chun Jason YR 2024 SN 2153-697X K1 Measurement K1 Temperature measurement K1 Three-dimensional displays K1 Temperature K1 Design automation K1 Asia K1 Error correction codes K1 3D NAND flash K1 accurate wear metric K1 wear degree SP 442 OP 447 LK http://dx.doi.org/https://doi.org/10.1109/ASP-DAC58780.2024.10473972 DO https://doi.org/10.1109/ASP-DAC58780.2024.10473972 SF ELIB - SuUB Bremen
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