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BEW-YOLO: An Improved Method for PCB Defect Detection Based..:

, In: 2023 IEEE 29th International Conference on Parallel and Distributed Systems (ICPADS),
Li, Zhiyao ; Li, Aimin ; Zhang, Yuechen.. - p. 268-274 , 2023
Link: https://doi.org/10.1109/ICPADS60453.2023.00048