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1 Ergebnisse
1
Advanced Method for Predicting Lifetime of NAND Memory Data..:
, In:
2023 IEEE International Integrated Reliability Workshop (IIRW)
,
Lee, Ji Seok
;
Kim, Namyong
;
Kim, Shinhyung
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IIRW59383.2023.10477637
RT T1 <cTitle>2023 IEEE International Integrated Reliability Workshop (IIRW)</cTitle>: T1 <Title>Advanced Method for Predicting Lifetime of NAND Memory Data Retention Using Long term (1 Year) Characterization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10477637&Exemplar=1&LAN=DE A1 Lee, Ji Seok A1 Kim, Namyong A1 Kim, Shinhyung A1 Park, Il Han A1 Song, Hwangju A1 Lee, Kul A1 Cho, Young-Hoon A1 Hwang, Sangwon A1 Ko, Seungbum A1 Pae, Sangwoo YR 2023 SN 2374-8036 K1 Industries K1 Temperature distribution K1 Conferences K1 Reliability K1 Character recognition K1 Flash memories K1 NAND K1 Data Retention K1 LTDR K1 JEDEC K1 Prediction K1 Power-law Relationship K1 Lifespan SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IIRW59383.2023.10477637 DO https://doi.org/10.1109/IIRW59383.2023.10477637 SF ELIB - SuUB Bremen
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