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A Device to Circuit Framework for NBTI:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Chatterjee, Payel ; Thakor, Karansingh ; Bisht, Arnav Shaurya... - p. 1-6 , 2023
Link: https://doi.org/10.1109/IIRW59383.2023.10477643