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1
Exploring the NBTI Aging and PVT effects on RRAM-based FPGA..:
, In:
2023 IEEE International Integrated Reliability Workshop (IIRW)
,
Rizzi, Tommaso
;
Baroni, Andrea
;
Bertozzi, Davide
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IIRW59383.2023.10477644
RT T1 <cTitle>2023 IEEE International Integrated Reliability Workshop (IIRW)</cTitle>: T1 <Title>Exploring the NBTI Aging and PVT effects on RRAM-based FPGA Multiplexers Performance</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10477644&Exemplar=1&LAN=DE A1 Rizzi, Tommaso A1 Baroni, Andrea A1 Bertozzi, Davide A1 Wenger, Christian A1 Ielmini, Daniele A1 Zambelli, Cristian YR 2023 SN 2374-8036 K1 Negative bias temperature instability K1 Performance evaluation K1 Multiplexing K1 Degradation K1 Thermal variables control K1 Aging K1 Transistors K1 RRAM K1 NBTI K1 Reliability K1 Variability K1 MUX SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IIRW59383.2023.10477644 DO https://doi.org/10.1109/IIRW59383.2023.10477644 SF ELIB - SuUB Bremen
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