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Relationship between Trapping Centers, Charge Pumping, and ..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Moxim, S. J. ; Ashton, J. P. ; Anders, M. A... - p. 1-4 , 2023
Link: https://doi.org/10.1109/IIRW59383.2023.10477645