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1 Ergebnisse
1
Reliability Analysis of Random Telegraph Noisebased True Ra..:
, In:
2023 IEEE International Integrated Reliability Workshop (IIRW)
,
Zanotti, Tommaso
;
Ranjan, Alok
;
O'Shea, Sean J.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IIRW59383.2023.10477697
RT T1
2023 IEEE International Integrated Reliability Workshop (IIRW)
: T1
Reliability Analysis of Random Telegraph Noisebased True Random Number Generators
UL https://suche.suub.uni-bremen.de/peid=ieee-10477697&Exemplar=1&LAN=DE A1 Zanotti, Tommaso A1 Ranjan, Alok A1 O'Shea, Sean J. A1 Raghavan, Nagarajan A1 Thamankar, Ramesh A1 Pey, Kin Leong A1 Maria Puglisi, Francesco YR 2023 SN 2374-8036 K1 Silicon compounds K1 Logic gates K1 Reliability engineering K1 Generators K1 Dielectrics K1 Hafnium compounds K1 Reliability K1 Random Telegraph Noise (RTN) K1 True Random Number Generator (TRNG) K1 RTN instability K1 Circuit reliability K1 Gate dielectrics SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IIRW59383.2023.10477697 DO https://doi.org/10.1109/IIRW59383.2023.10477697 SF ELIB - SuUB Bremen
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