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1 Ergebnisse
1
On-Chip Monitoring of Time-Dependent Dielectric Breakdown (..:
, In:
2023 IEEE International Integrated Reliability Workshop (IIRW)
,
Darko, Emmanuel Nti
;
Bhatheja, Kushagra
;
Adjei, Daniel
.. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IIRW59383.2023.10477703
RT T1
2023 IEEE International Integrated Reliability Workshop (IIRW)
: T1
On-Chip Monitoring of Time-Dependent Dielectric Breakdown (TDDB) using a Novel Leakage Current Sensor with Digital Output
UL https://suche.suub.uni-bremen.de/peid=ieee-10477703&Exemplar=1&LAN=DE A1 Darko, Emmanuel Nti A1 Bhatheja, Kushagra A1 Adjei, Daniel A1 Strong, Matthew A1 Chen, Degang YR 2023 SN 2374-8036 K1 Current measurement K1 Capacitors K1 System-on-chip K1 Sensors K1 Dielectric breakdown K1 Leakage currents K1 Biomedical monitoring K1 aging K1 functional safety K1 on-chip monitoring K1 reliability K1 safety-critical K1 TDDB SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IIRW59383.2023.10477703 DO https://doi.org/10.1109/IIRW59383.2023.10477703 SF ELIB - SuUB Bremen
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