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1 Ergebnisse
1
Low-Frequency Noise Sources and Back-Gate Coupling Effects ..:
, In:
2023 IEEE International Integrated Reliability Workshop (IIRW)
,
Yadav, Nandakishor
;
Raffel, Yannick
;
Olivo, Ricardo Revello
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IIRW59383.2023.10477715
RT T1
2023 IEEE International Integrated Reliability Workshop (IIRW)
: T1
Low-Frequency Noise Sources and Back-Gate Coupling Effects in FDX-SOI Device
UL https://suche.suub.uni-bremen.de/peid=ieee-10477715&Exemplar=1&LAN=DE A1 Yadav, Nandakishor A1 Raffel, Yannick A1 Olivo, Ricardo Revello A1 Pirro, Luca A1 Kampfe, Thomas A1 Seidel, Konrad YR 2023 SN 2374-8036 K1 Performance evaluation K1 Couplings K1 MOSFET K1 Current measurement K1 Silicon-on-insulator K1 Implants K1 Logic gates K1 Thin body devices K1 FDSOI K1 Silicon-on-Insulator K1 Reliability K1 Low-frequency noise K1 Front-Gate K1 Back-Gate SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IIRW59383.2023.10477715 DO https://doi.org/10.1109/IIRW59383.2023.10477715 SF ELIB - SuUB Bremen
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