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1 Ergebnisse
1
A Quantifiable Detection of voids/Pores and Cracks in Scann..:
, In:
2023 6th International Conference on Recent Trends in Advance Computing (ICRTAC)
,
M, Sornalakshmi
;
G, Elizabeth Rani
;
M, Sakthimohan
... - p. 324-329 , 2023
Link:
https://doi.org/10.1109/ICRTAC59277.2023.10480807
RT T1 <cTitle>2023 6th International Conference on Recent Trends in Advance Computing (ICRTAC)</cTitle>: T1 <Title>A Quantifiable Detection of voids/Pores and Cracks in Scanning Electron Microscopic images using Machine Learning Techniques</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10480807&Exemplar=1&LAN=DE A1 M, Sornalakshmi A1 G, Elizabeth Rani A1 M, Sakthimohan A1 K, Karthiga Devi A1 M, Ponsuresh A1 M, Devadharshni. YR 2023 K1 Industries K1 Scanning electron microscopy K1 Machine learning algorithms K1 Metals K1 Banking K1 Prediction algorithms K1 Classification algorithms K1 Machine Learning K1 Scanning Electron microscope K1 Metal and Non-metal Image K1 Classification Algorithm K1 Regression Algorithm SP 324 OP 329 LK http://dx.doi.org/https://doi.org/10.1109/ICRTAC59277.2023.10480807 DO https://doi.org/10.1109/ICRTAC59277.2023.10480807 SF ELIB - SuUB Bremen
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