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1 Ergebnisse
1
Portable X-Pinch Driver Development for Dense Plasma Measur..:
, In:
2023 IEEE International Conference on Plasma Science (ICOPS)
,
Strucka, J.
;
Bland, S.
;
Yao, Y.
- p. 01-01 , 2023
Link:
https://doi.org/10.1109/ICOPS45740.2023.10481384
RT T1 <cTitle>2023 IEEE International Conference on Plasma Science (ICOPS)</cTitle>: T1 <Title>Portable X-Pinch Driver Development for Dense Plasma Measurements</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10481384&Exemplar=1&LAN=DE A1 Strucka, J. A1 Bland, S. A1 Yao, Y. YR 2023 SN 2576-7208 K1 Micrometers K1 Wires K1 Plasma measurements K1 Plasmas K1 Broadband communication SP 01 OP 01 LK http://dx.doi.org/https://doi.org/10.1109/ICOPS45740.2023.10481384 DO https://doi.org/10.1109/ICOPS45740.2023.10481384 SF ELIB - SuUB Bremen
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