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1 Ergebnisse
1
Vague set-based fault tree analysis of automotive high-volt..:
, In:
2023 Global Reliability and Prognostics and Health Management Conference (PHM-Hangzhou)
,
Zhang, Yingzhi
;
Liu, Siwei
;
Zhang, Changtao
.. - p. 1-7 , 2023
Link:
https://doi.org/10.1109/PHM-Hangzhou58797.2023.1048264
RT T1
2023 Global Reliability and Prognostics and Health Management Conference (PHM-Hangzhou)
: T1
Vague set-based fault tree analysis of automotive high-voltage relays
UL https://suche.suub.uni-bremen.de/peid=ieee-10482640&Exemplar=1&LAN=DE A1 Zhang, Yingzhi A1 Liu, Siwei A1 Zhang, Changtao A1 Wang, Xiaofeng A1 Cheng, Xihui YR 2023 K1 Failure analysis K1 High-voltage techniques K1 Logic gates K1 Probability K1 Electric vehicles K1 Reliability K1 Relays K1 High voltage relays K1 Fault trees K1 Vague sets K1 Importance SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/PHM-Hangzhou58797.2023.10482640 DO https://doi.org/10.1109/PHM-Hangzhou58797.2023.10482640 SF ELIB - SuUB Bremen
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