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1 Ergebnisse
1
On Managing Test-Time, Power, and Layer Assignment in 3D So..:
, In:
2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)
,
Banerjee, Sabyasachee
;
Majumder, Subhashis
;
Bhattacharya, Bhargab B.
- p. 684-689 , 2024
Link:
https://doi.org/10.1109/VLSID60093.2024.00121
RT T1 <cTitle>2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>On Managing Test-Time, Power, and Layer Assignment in 3D SoCs with Built-In-Self-Repair Modules</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10483315&Exemplar=1&LAN=DE A1 Banerjee, Sabyasachee A1 Majumder, Subhashis A1 Bhattacharya, Bhargab B. YR 2024 SN 2380-6923 K1 Three-dimensional displays K1 Embedded systems K1 Costs K1 Very large scale integration K1 Benchmark testing K1 Built-in self-repair (BISR) K1 Core Wrapper K1 SoC testing K1 ReBISR SP 684 OP 689 LK http://dx.doi.org/https://doi.org/10.1109/VLSID60093.2024.00121 DO https://doi.org/10.1109/VLSID60093.2024.00121 SF ELIB - SuUB Bremen
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