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1 Ergebnisse
1
A 0.8-V, 593-pA Trim-free Duty-cycled All CMOS Current Refe..:
, In:
2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)
,
Mittal, Chetan
;
Dey, Arnab
;
Banerjee, Anubhab
.. - p. 599-604 , 2024
Link:
https://doi.org/10.1109/VLSID60093.2024.00106
RT T1 <cTitle>2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>A 0.8-V, 593-pA Trim-free Duty-cycled All CMOS Current Reference for Ultra-Low Power IoT Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10483333&Exemplar=1&LAN=DE A1 Mittal, Chetan A1 Dey, Arnab A1 Banerjee, Anubhab A1 Ali, Ashfakh A1 Abbas, Zia YR 2024 SN 2380-6923 K1 Temperature sensors K1 Resistors K1 Temperature distribution K1 Sensitivity K1 Power demand K1 Voltage K1 Logic gates K1 Duty-cycling K1 CTAT K1 PTAT K1 trim-free K1 resistor-less K1 current reference SP 599 OP 604 LK http://dx.doi.org/https://doi.org/10.1109/VLSID60093.2024.00106 DO https://doi.org/10.1109/VLSID60093.2024.00106 SF ELIB - SuUB Bremen
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