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1 Ergebnisse
1
Structural Testing: Vmin Silicon Issues and Solutions:
, In:
2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)
,
Sonone, Prashant
;
R, Pradeep
- p. 708-711 , 2024
Link:
https://doi.org/10.1109/VLSID60093.2024.00125
RT T1 <cTitle>2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>Structural Testing: Vmin Silicon Issues and Solutions</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10483367&Exemplar=1&LAN=DE A1 Sonone, Prashant A1 R, Pradeep YR 2024 SN 2380-6923 K1 Temperature dependence K1 Voltage K1 Very large scale integration K1 Silicon K1 Timing K1 System-on-chip K1 Test pattern generators K1 At-speed Scan K1 Memory Built-in self-test (MBIST) K1 Vmin K1 Automated Test Equipment (ATE) K1 Post-Silicon testing SP 708 OP 711 LK http://dx.doi.org/https://doi.org/10.1109/VLSID60093.2024.00125 DO https://doi.org/10.1109/VLSID60093.2024.00125 SF ELIB - SuUB Bremen
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