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1 Ergebnisse
1
Genetic Algorithm Based Efficient Grouping Technique for Po..:
, In:
2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)
,
Kaibartta, Tanusree
;
Arora, Hitarth
;
Das, Debesh Kumar
- p. 730-735 , 2024
Link:
https://doi.org/10.1109/VLSID60093.2024.00129
RT T1 <cTitle>2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>Genetic Algorithm Based Efficient Grouping Technique for Post Bond Test and Crosstalk Faults Among TSVs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10483381&Exemplar=1&LAN=DE A1 Kaibartta, Tanusree A1 Arora, Hitarth A1 Das, Debesh Kumar YR 2024 SN 2380-6923 K1 Embedded systems K1 Metaheuristics K1 Crosstalk K1 Very large scale integration K1 Minimization K1 Circuit faults K1 Through-silicon vias K1 TSV K1 3D K1 Genetic Algorithm K1 Crosstalk faults SP 730 OP 735 LK http://dx.doi.org/https://doi.org/10.1109/VLSID60093.2024.00129 DO https://doi.org/10.1109/VLSID60093.2024.00129 SF ELIB - SuUB Bremen
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