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1 Ergebnisse
1
Unveiling Thermal Cross Talk in 5nm Gate-All-Around Stacked..:
, In:
2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)
,
Kumar, Vivek
;
Anand, Nischal
;
Rai, Rohit
.. - p. 49-54 , 2024
Link:
https://doi.org/10.1109/VLSID60093.2024.00013
RT T1 <cTitle>2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>Unveiling Thermal Cross Talk in 5nm Gate-All-Around Stacked Nanosheet FETs: A Machine Learning Perspective</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10483471&Exemplar=1&LAN=DE A1 Kumar, Vivek A1 Anand, Nischal A1 Rai, Rohit A1 Chauhan, Sneha A1 Pate, Jyoti YR 2024 SN 2380-6923 K1 Training K1 Analytical models K1 Temperature distribution K1 Lattices K1 Machine learning K1 Voltage K1 Predictive models K1 Stacked Nanosheet K1 Gate Resistance K1 ML based Device Modeling K1 Self Heating Effect SP 49 OP 54 LK http://dx.doi.org/https://doi.org/10.1109/VLSID60093.2024.00013 DO https://doi.org/10.1109/VLSID60093.2024.00013 SF ELIB - SuUB Bremen
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